Square & Round wafers mapping systems with different types of platform sizes. Measurement of resistivity, sheet resistance and calculate coating thickness. Completely integrated systems, direct indication of the calculed thickness, powerful graphical output of the results. Possible to measure over 5000 points on wafers overnight.
Automatic Mapping Four Point Probe Resistivity Measurements
- Measurement efficiency , consistency
- Adapted for Wafer and Solar application
- Cost reduction